70‐4: A Novel Fabrication Process for Enhancing the Reliability of IGZO Thin Film Transistor
Bokyoung Lee; Jungho Bang; Min-Joo Kim; Seung Hee Nam; Kwon-Shik Park; Jong Uk Bae; Soo Young Yoon
- Published
- Publisher
- Wiley
- Journal / collection
- SID Symposium Digest of Technical Papers
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1002/sdtp.18330
The original publisher provides the full text and its access options.
Cite this source
Bokyoung Lee; Jungho Bang; Min-Joo Kim; Seung Hee Nam; Kwon-Shik Park; Jong Uk Bae; Soo Young Yoon. 70‐4: A Novel Fabrication Process for Enhancing the Reliability of IGZO Thin Film Transistor. SID Symposium Digest of Technical Papers. 2025-06. https://doi.org/10.1002/sdtp.18330