Combined effect of total ionizing dose and electromagnetic pulse on bipolar junction transistor
Meiqing Zhong; Cui Meng; Yinong Liu; Chicheng Liu; Lanfeng Yuan; Xinfei Liu; Lin Wen; Qi Guo; Rui Ding; Weiheng Shao
- Published
- Publisher
- AIP Publishing
- Journal / collection
- AIP Advances
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1063/5.0304706
The original publisher provides the full text and its access options.
Cite this source
Meiqing Zhong; Cui Meng; Yinong Liu; Chicheng Liu; Lanfeng Yuan; Xinfei Liu; Lin Wen; Qi Guo; Rui Ding; Weiheng Shao. Combined effect of total ionizing dose and electromagnetic pulse on bipolar junction transistor. AIP Advances. 2025-12-01. https://doi.org/10.1063/5.0304706