Hybrid Convolutional Neural Network‐Analytical Model for Prediction of Line Edge Roughness‐Induced Performance Variations in Fin‐Shaped Field‐Effect Transistor Devices and SRAM
Jaehyuk Lim; Myongjin Kim; Changwoo Han; Hyoung Won Baac; Changhwan Shin
- Published
- Publisher
- Wiley
- Journal / collection
- Advanced Intelligent Systems
- Research area
- AI & compute
- Source type
- Journal article
- DOI
- 10.1002/aisy.202500835
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Cite this source
Jaehyuk Lim; Myongjin Kim; Changwoo Han; Hyoung Won Baac; Changhwan Shin. Hybrid Convolutional Neural Network‐Analytical Model for Prediction of Line Edge Roughness‐Induced Performance Variations in Fin‐Shaped Field‐Effect Transistor Devices and SRAM. Advanced Intelligent Systems. 2025-12-10. https://doi.org/10.1002/aisy.202500835