Toward High-Mobility and High-Reliability Oxide Semiconductor Thin-Film Transistors
Yusaku Magari
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/imfedk68916.2025.11353668
The original publisher provides the full text and its access options.
Cite this source
Yusaku Magari. Toward High-Mobility and High-Reliability Oxide Semiconductor Thin-Film Transistors. 2025 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK). 2025-11-13. https://doi.org/10.1109/imfedk68916.2025.11353668