On the Accurate Evaluation of Intrinsic Electron Mobility on Oxide Semiconductor Transistors
Chen Wang; Longzhong Liao; Kai Jiang; Ziheng Wang; Jinxiu Zhao; Guo Zhou; Mengwei Si
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Electron Device Letters
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/led.2025.3604471
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Cite this source
Chen Wang; Longzhong Liao; Kai Jiang; Ziheng Wang; Jinxiu Zhao; Guo Zhou; Mengwei Si. On the Accurate Evaluation of Intrinsic Electron Mobility on Oxide Semiconductor Transistors. IEEE Electron Device Letters. 2025-11. https://doi.org/10.1109/led.2025.3604471