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Research literature / Conference paper

Deep Learning Powered 3D X-Ray Nanotomography for Failure Analysis of Advanced Semiconductor Packages

Allen Gu; Masako Terada; Jeffrey Marshman; Andriy Andreyev; Thomas Rodgers

Published
Publisher
IEEE
Journal / collection
2025 IEEE 32nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
Research area
AI & compute
Source type
Conference paper
DOI
10.1109/ipfa65338.2025.11256588

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Allen Gu; Masako Terada; Jeffrey Marshman; Andriy Andreyev; Thomas Rodgers. Deep Learning Powered 3D X-Ray Nanotomography for Failure Analysis of Advanced Semiconductor Packages. 2025 IEEE 32nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). 2025-08-05. https://doi.org/10.1109/ipfa65338.2025.11256588

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