Verification of the die Temperature of a SiC Transistor Based on the Thermal Imaging and Machine Learning
Poznań University of Technology; Krzysztof Dziarski; Arkadiusz Hulewicz
- Published
- Publisher
- PIAP - Industrial Research Institute for Automation and Measurements
- Journal / collection
- Pomiary Automatyka Robotyka
- Research area
- AI & compute
- Source type
- Journal article
- DOI
- 10.14313/par_257/119
The original publisher provides the full text and its access options.
Cite this source
Poznań University of Technology; Krzysztof Dziarski; Arkadiusz Hulewicz. Verification of the die Temperature of a SiC Transistor Based on the Thermal Imaging and Machine Learning. Pomiary Automatyka Robotyka. 2025-09-18. https://doi.org/10.14313/par_257/119