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Research literature / Conference paper

Effect of Voltage Probes on the Characterisation of Switching Processes in Wide-bandgap Semiconductor Devices

Yishun Yan; Lurenhang Wang; Xuchong Cai; Mingcheng Ma; Yanchen Pan; Dianguo Xu

Published
Publisher
IEEE
Journal / collection
2025 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/wipda-asia63772.2025.11183706

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Yishun Yan; Lurenhang Wang; Xuchong Cai; Mingcheng Ma; Yanchen Pan; Dianguo Xu. Effect of Voltage Probes on the Characterisation of Switching Processes in Wide-bandgap Semiconductor Devices. 2025 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia). 2025-08-15. https://doi.org/10.1109/wipda-asia63772.2025.11183706

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