Embedded Machine Vision: Machine Learning and Performance Metrics
Anton Holosha; Serhii Kovbasa; Sergey Edward Lyshevski
- Published
- Publisher
- IEEE
- Journal / collection
- 2026 IEEE 18th International Conference on Advanced Trends in Radioelectronics, Telecommunications and Computer Engineering (TCSET)
- Research area
- AI & compute
- Source type
- Conference paper
- DOI
- 10.1109/tcset65181.2026.11461102
The original publisher provides the full text and its access options.
Cite this source
Anton Holosha; Serhii Kovbasa; Sergey Edward Lyshevski. Embedded Machine Vision: Machine Learning and Performance Metrics. 2026 IEEE 18th International Conference on Advanced Trends in Radioelectronics, Telecommunications and Computer Engineering (TCSET). 2026-02-17. https://doi.org/10.1109/tcset65181.2026.11461102