Valence Band EELS Tomography of Poly-Si Semiconductor Nanostructure
Ethan Field; Yun-Yu Wang; Xay Saythavy; Ning Lu; Zhouguang Wang; Tom George; Qiang Jin
- Published
- Publisher
- Oxford University Press (OUP)
- Journal / collection
- Microscopy Today
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1093/mictod/qaaf054
The original publisher provides the full text and its access options.
Cite this source
Ethan Field; Yun-Yu Wang; Xay Saythavy; Ning Lu; Zhouguang Wang; Tom George; Qiang Jin. Valence Band EELS Tomography of Poly-Si Semiconductor Nanostructure. Microscopy Today. 2025-07. https://doi.org/10.1093/mictod/qaaf054