Semiconductor Sensor Array-Based Fault Diagnosis for High-Voltage Cable Insulation Erosion
Kun Liang; Lipeng Zhong; Xiaoli Duan; Sanwei Liu; Wenjie Li
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 IEEE 8th International Electrical and Energy Conference (CIEEC)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/cieec64805.2025.11116182
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Cite this source
Kun Liang; Lipeng Zhong; Xiaoli Duan; Sanwei Liu; Wenjie Li. Semiconductor Sensor Array-Based Fault Diagnosis for High-Voltage Cable Insulation Erosion. 2025 IEEE 8th International Electrical and Energy Conference (CIEEC). 2025-05-16. https://doi.org/10.1109/cieec64805.2025.11116182