Skip to content
Independent research & intelligence
OPEN VARIABLE

Evidence-First Signal Intelligence

Menu

Research literature / Conference paper

Algorithm for automated alignment and search of contact areas on semiconductor wafers

Igor Shraifel; Andrey Mikhailov; Igor Maltcev; Irina Mikhailova; Aleksandr Zelensky; Mikhail Kharkov; Viacheslav Voronin; Kirill Danilin; Evgenii Semenishchev

Published
Publisher
SPIE
Journal / collection
Real-Time Image Processing and Deep Learning 2026
Research area
Semiconductors
Source type
Conference paper
DOI
10.1117/12.3101791

Read the original source ↗

The original publisher provides the full text and its access options.

Cite this source

Igor Shraifel; Andrey Mikhailov; Igor Maltcev; Irina Mikhailova; Aleksandr Zelensky; Mikhail Kharkov; Viacheslav Voronin; Kirill Danilin; Evgenii Semenishchev. Algorithm for automated alignment and search of contact areas on semiconductor wafers. Real-Time Image Processing and Deep Learning 2026. 2026-06-11. https://doi.org/10.1117/12.3101791

Download RIS