FAD‐Net: An Efficient Architecture for Defect Recognition in Semiconductor Wafers
Imran Khan Mirani; Naigong Yu; Malak Abid Ali Khan
- Published
- Publisher
- Wiley
- Journal / collection
- Quality and Reliability Engineering International
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1002/qre.70321
The original publisher provides the full text and its access options.
Cite this source
Imran Khan Mirani; Naigong Yu; Malak Abid Ali Khan. FAD‐Net: An Efficient Architecture for Defect Recognition in Semiconductor Wafers. Quality and Reliability Engineering International. 2026-07-05. https://doi.org/10.1002/qre.70321