In Situ Monitoring of Diffusive Morphology Transformation of Semiconductor Materials under Joule Heating
Taeyeong Kim; Bong Jae Lee; Jungchul Lee
- Published
- Publisher
- American Chemical Society (ACS)
- Journal / collection
- ACS Applied Materials & Interfaces
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1021/acsami.5c25601
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Cite this source
Taeyeong Kim; Bong Jae Lee; Jungchul Lee. In Situ Monitoring of Diffusive Morphology Transformation of Semiconductor Materials under Joule Heating. ACS Applied Materials & Interfaces. 2026-03-23. https://doi.org/10.1021/acsami.5c25601