Defect-Modulated In 2 S 3-3 x O 3 x Thin-Film Transistor for Enhanced NO 2 Sensing
C. Liang; J. Hao; Y. Zhou; P. He; R. Yang; Y. Guo; W. Hu; Y. He
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Sensors Journal
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/jsen.2025.3646552
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Cite this source
C. Liang; J. Hao; Y. Zhou; P. He; R. Yang; Y. Guo; W. Hu; Y. He. Defect-Modulated In 2 S 3-3 x O 3 x Thin-Film Transistor for Enhanced NO 2 Sensing. IEEE Sensors Journal. 2026-02-15. https://doi.org/10.1109/jsen.2025.3646552