Review of Selected Quantum Measurements Applied to Embedded Quantum Well in Nanoscale Transistor
Jeremy Belhassen; Avraham Chelly
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Journal of Selected Topics in Quantum Electronics
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/jstqe.2024.3447163
The original publisher provides the full text and its access options.
Cite this source
Jeremy Belhassen; Avraham Chelly. Review of Selected Quantum Measurements Applied to Embedded Quantum Well in Nanoscale Transistor. IEEE Journal of Selected Topics in Quantum Electronics. 2025-09. https://doi.org/10.1109/jstqe.2024.3447163