A Transistor Clamp Circuit of On-state Voltage Drop for SiC MOSFET Temperature Monitoring
Yixiang Zhao; Hong Li; Xiaofei Hu; Kuang Zhang
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/wipda-asia63772.2025.11183935
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Cite this source
Yixiang Zhao; Hong Li; Xiaofei Hu; Kuang Zhang. A Transistor Clamp Circuit of On-state Voltage Drop for SiC MOSFET Temperature Monitoring. 2025 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia). 2025-08-15. https://doi.org/10.1109/wipda-asia63772.2025.11183935