Scaling challenges and engineering approaches for oxide semiconductor FETs toward display and memory systems
Yong Seon Hwang; Hye Jin Son; I. Sak Lee; Kyungmoon Kwak; Jong Bin An; Hyun Jae Kim
- Published
- Publisher
- Royal Society of Chemistry (RSC)
- Journal / collection
- Nanoscale
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1039/d6nr01611a
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Cite this source
Yong Seon Hwang; Hye Jin Son; I. Sak Lee; Kyungmoon Kwak; Jong Bin An; Hyun Jae Kim. Scaling challenges and engineering approaches for oxide semiconductor FETs toward display and memory systems. Nanoscale. 2026. https://doi.org/10.1039/d6nr01611a