Screening for Manufacturing Defects that Manifest as Silent Data Errors in Data Center Processors
D. Lerner; E. Hansen; S. Sakthivelu; C. Carrizo; S. Tzu-Lin; T. Macieira; B. Kelly
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 IEEE International Electron Devices Meeting (IEDM)
- Research area
- AI & compute
- Source type
- Conference paper
- DOI
- 10.1109/iedm50572.2025.11353795
The original publisher provides the full text and its access options.
Cite this source
D. Lerner; E. Hansen; S. Sakthivelu; C. Carrizo; S. Tzu-Lin; T. Macieira; B. Kelly. Screening for Manufacturing Defects that Manifest as Silent Data Errors in Data Center Processors. 2025 IEEE International Electron Devices Meeting (IEDM). 2025-12-06. https://doi.org/10.1109/iedm50572.2025.11353795