The indirect thermographic measurement of the transistor die temperature made through the IR window
Krzysztof Dziarski; Arkadiusz Hulewicz
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Infrared Physics & Technology
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.infrared.2025.106149
The original publisher provides the full text and its access options.
Cite this source
Krzysztof Dziarski; Arkadiusz Hulewicz. The indirect thermographic measurement of the transistor die temperature made through the IR window. Infrared Physics & Technology. 2026-01. https://doi.org/10.1016/j.infrared.2025.106149