A simple and effective carrier lifetime characterization for semiconductor thin films
Bao Quy Le; Tuan Nguyen Van; Dat Tran Quang; Vi Le Dinh; Thin Pham Van; Nguyen Cuc Thi Kim
- Published
- Publisher
- IOP Publishing
- Journal / collection
- Journal of Semiconductors
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1088/1674-4926/24090005
The original publisher provides the full text and its access options.
Cite this source
Bao Quy Le; Tuan Nguyen Van; Dat Tran Quang; Vi Le Dinh; Thin Pham Van; Nguyen Cuc Thi Kim. A simple and effective carrier lifetime characterization for semiconductor thin films. Journal of Semiconductors. 2025-07-01. https://doi.org/10.1088/1674-4926/24090005