Estimating the Stochastic Reliability of a KP961 Power Transistor under Thermal Cycling Using the Monte Carlo Simulation
T. I. Isabekova; A. R. Shakhmaeva
- Published
- Publisher
- Pleiades Publishing Ltd
- Journal / collection
- Russian Microelectronics
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1134/s1063739726600305
The original publisher provides the full text and its access options.
Cite this source
T. I. Isabekova; A. R. Shakhmaeva. Estimating the Stochastic Reliability of a KP961 Power Transistor under Thermal Cycling Using the Monte Carlo Simulation. Russian Microelectronics. 2026-04. https://doi.org/10.1134/s1063739726600305