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Research literature / Conference paper

Computer Vission IntegratedCircuit Fault Detection Systems for Semiconductor Quality Control

Deepak Shahakar; Shriram Vijay Deshmukh; Regina Mathias; Hare Krishna Mishra; Tegbir Singh; Vasujadevi Midasala

Published
Publisher
IEEE
Journal / collection
2025 Tenth International Conference on Science Technology Engineering and Mathematics (ICONSTEM)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/iconstem65670.2025.11374681

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Deepak Shahakar; Shriram Vijay Deshmukh; Regina Mathias; Hare Krishna Mishra; Tegbir Singh; Vasujadevi Midasala. Computer Vission IntegratedCircuit Fault Detection Systems for Semiconductor Quality Control. 2025 Tenth International Conference on Science Technology Engineering and Mathematics (ICONSTEM). 2025-11-06. https://doi.org/10.1109/iconstem65670.2025.11374681

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