Impact of Fringing Fields on Electrostatic and Analog/Radio Frequency Performance of Graded Channel Junctionless Gate-All-Around Metal Oxide Field Effect Transistor
Vidyadhar Gupta; Vedvrat; Abhinav Gupta; Amit Kumar Pandey; Tarun Kumar Gupta; Shipra Upadhyay
- Published
- Publisher
- Pleiades Publishing Ltd
- Journal / collection
- Semiconductors
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1134/s1063782625602122
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Cite this source
Vidyadhar Gupta; Vedvrat; Abhinav Gupta; Amit Kumar Pandey; Tarun Kumar Gupta; Shipra Upadhyay. Impact of Fringing Fields on Electrostatic and Analog/Radio Frequency Performance of Graded Channel Junctionless Gate-All-Around Metal Oxide Field Effect Transistor. Semiconductors. 2025-09. https://doi.org/10.1134/s1063782625602122