Temperature-dependent modeling of exciton-polariton bistability in semiconductor microcavities
R. Wushouer; O. A. Egorov; R. Buschlinger; U. Peschel
- Published
- Publisher
- American Physical Society (APS)
- Journal / collection
- Physical Review B
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1103/gpj9-g3rt
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Cite this source
R. Wushouer; O. A. Egorov; R. Buschlinger; U. Peschel. Temperature-dependent modeling of exciton-polariton bistability in semiconductor microcavities. Physical Review B. 2026-08-17. https://doi.org/10.1103/gpj9-g3rt