Dimensional Scaling Effect in Percolative Oxide Semiconductor Transistors
Robert Tseng; Yi-Hou Kuo; Yi-Yu Pan; Zheng-Hong Li; Sung-Tsun Wang; Ciao-Fen Chen; Shun-Tsung Lo; Yu-Cheng Chan; Ya-Jing Wu; Shih-Chieh Chen; Cheng-Chen Kuo; Chun-Chen Wang; Cheng-Hsien Wu; Wen-Hsiang Lu; Xinyu Bao; Nguyen Thi Phuong Thao; Emi Minamitan; Ali Javey; Chun-Liang Lin; Der-Hsien Lien
- Published
- Publisher
- American Chemical Society (ACS)
- Journal / collection
- ACS Nano
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1021/acsnano.5c21838
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Cite this source
Robert Tseng; Yi-Hou Kuo; Yi-Yu Pan; Zheng-Hong Li; Sung-Tsun Wang; Ciao-Fen Chen; Shun-Tsung Lo; Yu-Cheng Chan; Ya-Jing Wu; Shih-Chieh Chen; Cheng-Chen Kuo; Chun-Chen Wang; Cheng-Hsien Wu; Wen-Hsiang Lu; Xinyu Bao; Nguyen Thi Phuong Thao; Emi Minamitan; Ali Javey; Chun-Liang Lin; Der-Hsien Lien. Dimensional Scaling Effect in Percolative Oxide Semiconductor Transistors. ACS Nano. 2026-04-06. https://doi.org/10.1021/acsnano.5c21838