GLCA-Net: Global-Local Contextual Attention Network for Real-Time Insulated Gate Bipolar Transistor Void Defect Segmentation Based on Computed Laminography System
Yan Li; Shuangquan Liu; Cunfeng Wei; Chao Fan
- Published
- Publisher
- Springer Science and Business Media LLC
- Journal / collection
- Journal of Nondestructive Evaluation
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1007/s10921-026-01402-1
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Cite this source
Yan Li; Shuangquan Liu; Cunfeng Wei; Chao Fan. GLCA-Net: Global-Local Contextual Attention Network for Real-Time Insulated Gate Bipolar Transistor Void Defect Segmentation Based on Computed Laminography System. Journal of Nondestructive Evaluation. 2026-07-08. https://doi.org/10.1007/s10921-026-01402-1