Unveiling the Hidden Geometry of OECTs: Contact‐Semiconductor Overlap Driven Errors in Volumetric Capacitance
Renan Colucci; Marcos Luginieski; Germán D. Gómez Higuita; Gerwin Dijk; Bianca de A. Feitosa; Yaakov Tuchman; Alberto Salleo; Gregório Couto Faria
- Published
- Publisher
- Wiley
- Journal / collection
- Advanced Materials Technologies
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1002/admt.71176
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Cite this source
Renan Colucci; Marcos Luginieski; Germán D. Gómez Higuita; Gerwin Dijk; Bianca de A. Feitosa; Yaakov Tuchman; Alberto Salleo; Gregório Couto Faria. Unveiling the Hidden Geometry of OECTs: Contact‐Semiconductor Overlap Driven Errors in Volumetric Capacitance. Advanced Materials Technologies. 2026-07-17. https://doi.org/10.1002/admt.71176