A new method to observing negative capacitance phenomena in semiconductor materials
Xiangjun Meng; Zheng Huan; Yunlong Sun; Jianyu Hu; Zhonghua Li
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Measurement
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.measurement.2025.117326
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Cite this source
Xiangjun Meng; Zheng Huan; Yunlong Sun; Jianyu Hu; Zhonghua Li. A new method to observing negative capacitance phenomena in semiconductor materials. Measurement. 2025-08. https://doi.org/10.1016/j.measurement.2025.117326