SAE-Diffu: A Controllable Data Enhancement Method for Semiconductor Chip Defect Images
Fuqin Deng; Qiqing Dong; Junhan Pu; Lanhui Fu; Qingshan Xia; Zhi Xu; Nannan Li; Min Zhao
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 IEEE 23rd International Conference on Industrial Informatics (INDIN)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/indin64977.2025.11279544
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Cite this source
Fuqin Deng; Qiqing Dong; Junhan Pu; Lanhui Fu; Qingshan Xia; Zhi Xu; Nannan Li; Min Zhao. SAE-Diffu: A Controllable Data Enhancement Method for Semiconductor Chip Defect Images. 2025 IEEE 23rd International Conference on Industrial Informatics (INDIN). 2025-07-12. https://doi.org/10.1109/indin64977.2025.11279544