Fabrication Defect Detection and Characterization of Semiconductor Devices from SEM Images Using Morphological Image Processing
Sakhawat Hossen Rakib; A. S. M. Bakibillah; Tazin Hossain; Muhammad Towfiqur Rahman; Md Shafiul Alam; Md. Shofiqul Islam; Tasnia Hossain
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 IEEE International Women in Engineering (WIE) Conference on Electrical and Computer Engineering (WIECON-ECE)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/wiecon-ece69386.2025.11526094
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Cite this source
Sakhawat Hossen Rakib; A. S. M. Bakibillah; Tazin Hossain; Muhammad Towfiqur Rahman; Md Shafiul Alam; Md. Shofiqul Islam; Tasnia Hossain. Fabrication Defect Detection and Characterization of Semiconductor Devices from SEM Images Using Morphological Image Processing. 2025 IEEE International Women in Engineering (WIE) Conference on Electrical and Computer Engineering (WIECON-ECE). 2025-12-21. https://doi.org/10.1109/wiecon-ece69386.2025.11526094