Fake Review Detection using Machine Learning and Deep Learning Models
B. Chaturya; K. Johith Sainath Reddy; M. Pramod Chandra; I. Bhupal Reddy
- Published
- Publisher
- IEEE
- Journal / collection
- 2026 4th International Conference on Inventive Computing and Informatics (ICICI)
- Research area
- AI & compute
- Source type
- Conference paper
- DOI
- 10.1109/icici68773.2026.11581067
The original publisher provides the full text and its access options.
Cite this source
B. Chaturya; K. Johith Sainath Reddy; M. Pramod Chandra; I. Bhupal Reddy. Fake Review Detection using Machine Learning and Deep Learning Models. 2026 4th International Conference on Inventive Computing and Informatics (ICICI). 2026-06-10. https://doi.org/10.1109/icici68773.2026.11581067