Explainable Machine Learning for Resource-Efficient Fault Classification in Power Grid Oscillograms: Impact of Measurement Channel Selection
Ezgi Guney
- Published
- Publisher
- IEEE
- Journal / collection
- 2026 International Conference on Control, Automation and Diagnosis (ICCAD)
- Research area
- AI & compute
- Source type
- Conference paper
- DOI
- 10.1109/iccad69956.2026.11643114
The original publisher provides the full text and its access options.
Cite this source
Ezgi Guney. Explainable Machine Learning for Resource-Efficient Fault Classification in Power Grid Oscillograms: Impact of Measurement Channel Selection. 2026 International Conference on Control, Automation and Diagnosis (ICCAD). 2026-07. https://doi.org/10.1109/iccad69956.2026.11643114