Semiconductor wafer chip defect detection algorithm based on improved YOLOV8
Yue Chen; Huiming Qu
- Published
- Publisher
- SPIE
- Journal / collection
- Fourth International Conference on Optics and Machine Vision (ICOMV 2025)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1117/12.3071857
The original publisher provides the full text and its access options.
Cite this source
Yue Chen; Huiming Qu. Semiconductor wafer chip defect detection algorithm based on improved YOLOV8. Fourth International Conference on Optics and Machine Vision (ICOMV 2025). 2025-08-15. https://doi.org/10.1117/12.3071857