Fatigue of ferroelectric field effect transistor: mechanisms and optimization strategies
Yu Song; Pengfei Jiang; Pan Xu; Xueyang Peng; Qianqian Wei; Qingyi Yan; Wei Wei; Yuan Wang; Xiao Long; Tiancheng Gong; Yang Yang; Eskilla Venkata Ramana; Qing Luo
- Published
- Publisher
- IOP Publishing
- Journal / collection
- Journal of Semiconductors
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1088/1674-4926/24100010
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Yu Song; Pengfei Jiang; Pan Xu; Xueyang Peng; Qianqian Wei; Qingyi Yan; Wei Wei; Yuan Wang; Xiao Long; Tiancheng Gong; Yang Yang; Eskilla Venkata Ramana; Qing Luo. Fatigue of ferroelectric field effect transistor: mechanisms and optimization strategies. Journal of Semiconductors. 2025-06-01. https://doi.org/10.1088/1674-4926/24100010