An Analytical Theory of Avalanche Breakdown in p-n Junctions Derived From Semiconductor Band Structure
Huayou Liu; Jing Zhang; Abdelmadjid Mesli; Yaping Dan
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Electron Devices
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/ted.2026.3698391
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Cite this source
Huayou Liu; Jing Zhang; Abdelmadjid Mesli; Yaping Dan. An Analytical Theory of Avalanche Breakdown in p-n Junctions Derived From Semiconductor Band Structure. IEEE Transactions on Electron Devices. 2026-08. https://doi.org/10.1109/ted.2026.3698391