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Cascading Failure Analysis in Semiconductor Supply Chain Networks Based on Node Importance and Emergency Risk

Zhenzhen Ma; Sijia Guo; Yuhuai Zhang

Published
Publisher
Elsevier BV
Research area
Semiconductors
Source type
Preprint / posted paper
DOI
10.2139/ssrn.6809478

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Zhenzhen Ma; Sijia Guo; Yuhuai Zhang. Cascading Failure Analysis in Semiconductor Supply Chain Networks Based on Node Importance and Emergency Risk. Elsevier BV. 2026. https://doi.org/10.2139/ssrn.6809478

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