Variational Quantum Circuit Regressors for Joint Optimization of Transistor Scaling and Die Footprint in Advanced IC Manufacturing
G Kiran Kumar; Nandimandalam Sivarama Raju; Mohammad Nawaz; Nayudu Pradeep
- Published
- Publisher
- MSR Edusoft Private Limited
- Journal / collection
- Journal of Science Engineering Technology and Management Sciences
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.64771/jsetms.2026.v03.i04.pp25-36
The original publisher provides the full text and its access options.
Cite this source
G Kiran Kumar; Nandimandalam Sivarama Raju; Mohammad Nawaz; Nayudu Pradeep. Variational Quantum Circuit Regressors for Joint Optimization of Transistor Scaling and Die Footprint in Advanced IC Manufacturing. Journal of Science Engineering Technology and Management Sciences. 2026-04. https://doi.org/10.64771/jsetms.2026.v03.i04.pp25-36