Hydrogen‐State‐Engineered Oxide Semiconductor Channels Enabling Reliable 2T0C DRAM Operation
Jun‐Yeoub Lee; Taewon Hwang; Su‐Hwan Choi; Hye‐Jin Oh; Chang‐Kyun Park; Jin‐Seong Park
- Published
- Publisher
- Wiley
- Journal / collection
- Advanced Electronic Materials
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1002/aelm.202500825
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Cite this source
Jun‐Yeoub Lee; Taewon Hwang; Su‐Hwan Choi; Hye‐Jin Oh; Chang‐Kyun Park; Jin‐Seong Park. Hydrogen‐State‐Engineered Oxide Semiconductor Channels Enabling Reliable 2T0C DRAM Operation. Advanced Electronic Materials. 2026-05-15. https://doi.org/10.1002/aelm.202500825