Thermoreflectance Microscopy for the Steady-State and Transient Thermal Analysis of Semiconductor Devices
Chan Bae Jeong; Kim Dong Uk; Dongmok Kim; Mun Goung Jeong; Ki Soo Chang
- Published
- Publisher
- ASM International
- Journal / collection
- International Symposium for Testing and Failure Analysis
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.31399/asm.cp.istfa2025p0556
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Cite this source
Chan Bae Jeong; Kim Dong Uk; Dongmok Kim; Mun Goung Jeong; Ki Soo Chang. Thermoreflectance Microscopy for the Steady-State and Transient Thermal Analysis of Semiconductor Devices. International Symposium for Testing and Failure Analysis. 2025-11-16. https://doi.org/10.31399/asm.cp.istfa2025p0556