Photogrammetry-Enabled Digital Twins for Semiconductor Education and Workforce Development
John Paul Martin Encinas; Yu-Zheng Lin; Bono Po-Jen Shih; Josh Dean; Anh Minh Nguyen; Aurora Namjoshi; Ahmed Hussain J Alhamadah; Shalaka Satam; Jesus Pacheco; Soheil Salehi; Pratik Satam
- Published
- Publisher
- ACM
- Journal / collection
- Proceedings of the Great Lakes Symposium on VLSI 2026
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1145/3787109.3816048
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Cite this source
John Paul Martin Encinas; Yu-Zheng Lin; Bono Po-Jen Shih; Josh Dean; Anh Minh Nguyen; Aurora Namjoshi; Ahmed Hussain J Alhamadah; Shalaka Satam; Jesus Pacheco; Soheil Salehi; Pratik Satam. Photogrammetry-Enabled Digital Twins for Semiconductor Education and Workforce Development. Proceedings of the Great Lakes Symposium on VLSI 2026. 2026-06-22. https://doi.org/10.1145/3787109.3816048