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Comparative Analysis of Leakage Current in 28-Transistor Full Adders: Conventional CMOS vs SCCMOS

Harshitha S; M Sathish Kumar

Published
Publisher
IEEE
Journal / collection
2026 IEEE 6th International Conference on VLSI Systems, Architecture, Technology and Applications (VLSI SATA)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/vlsisata69163.2026.11610000

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Harshitha S; M Sathish Kumar. Comparative Analysis of Leakage Current in 28-Transistor Full Adders: Conventional CMOS vs SCCMOS. 2026 IEEE 6th International Conference on VLSI Systems, Architecture, Technology and Applications (VLSI SATA). 2026-06. https://doi.org/10.1109/vlsisata69163.2026.11610000

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