Radiation-Hardening Techniques for CMOS Technologies: a Case Study Rectangular Enclosed-Gate Transistor Design
Grigorii K. Grishin; Sergei V. Ryzhov; Vladimir V. Andreev; Vadim V. Kuznetsov
- Published
- Publisher
- IEEE
- Journal / collection
- 2026 IEEE Ural-Siberian Conference on Biomedical Engineering, Radioelectronics and Information Technology (USBEREIT)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/usbereit70063.2026.11581036
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Cite this source
Grigorii K. Grishin; Sergei V. Ryzhov; Vladimir V. Andreev; Vadim V. Kuznetsov. Radiation-Hardening Techniques for CMOS Technologies: a Case Study Rectangular Enclosed-Gate Transistor Design. 2026 IEEE Ural-Siberian Conference on Biomedical Engineering, Radioelectronics and Information Technology (USBEREIT). 2026-05-14. https://doi.org/10.1109/usbereit70063.2026.11581036