A novel observation of negative differential resistance in a standard CMOS transistor and its application to a compact frequency doubler
Been Kwak; Youngchan Cho; Changhyeon Han; Jongwoo Lee; Sangwan Kim; Yunho Shin; Joonhyeok Choi; Dongbin Kim; Seung June Lee; Seunghoo Lee; Hyun-Min Kim; Wonjun Shin; Daewoong Kwon
- Published
- Publisher
- Springer Science and Business Media LLC
- Journal / collection
- Microsystems & Nanoengineering
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1038/s41378-026-01276-3
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Cite this source
Been Kwak; Youngchan Cho; Changhyeon Han; Jongwoo Lee; Sangwan Kim; Yunho Shin; Joonhyeok Choi; Dongbin Kim; Seung June Lee; Seunghoo Lee; Hyun-Min Kim; Wonjun Shin; Daewoong Kwon. A novel observation of negative differential resistance in a standard CMOS transistor and its application to a compact frequency doubler. Microsystems & Nanoengineering. 2026-05-20. https://doi.org/10.1038/s41378-026-01276-3