Heterojunction‐Driven Stochasticity: Bi‐Heterojunction Noise‐Enhanced Negative Transconductance Transistor in Image Generation (Adv. Mater. 41/2025)
Youngmin Han; Ryun‐Han Koo; Jaechan Song; Chang‐Hyun Kim; Eun Kwang Lee; Wonjun Shin; Hocheon Yoo
- Published
- Publisher
- Wiley
- Journal / collection
- Advanced Materials
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1002/adma.70827
The original publisher provides the full text and its access options.
Cite this source
Youngmin Han; Ryun‐Han Koo; Jaechan Song; Chang‐Hyun Kim; Eun Kwang Lee; Wonjun Shin; Hocheon Yoo. Heterojunction‐Driven Stochasticity: Bi‐Heterojunction Noise‐Enhanced Negative Transconductance Transistor in Image Generation (Adv. Mater. 41/2025). Advanced Materials. 2025-10. https://doi.org/10.1002/adma.70827