Reliability Analysis of IGZO Thin-Film Transistor for Wearable Biosensing Applications
Anchal Thakur; Samriti Sharma; Jaya Madan; Rahul Pandey
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Device and Materials Reliability
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/tdmr.2026.3684091
The original publisher provides the full text and its access options.
Cite this source
Anchal Thakur; Samriti Sharma; Jaya Madan; Rahul Pandey. Reliability Analysis of IGZO Thin-Film Transistor for Wearable Biosensing Applications. IEEE Transactions on Device and Materials Reliability. 2026-06. https://doi.org/10.1109/tdmr.2026.3684091