Highly Endurable Single Transistor Latch Operation Using Band-to-Band Tunneling
Jun-Young Park; Yeon-Woo Cho; Joon-Kyu Han
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Electron Device Letters
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/led.2025.3571059
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Cite this source
Jun-Young Park; Yeon-Woo Cho; Joon-Kyu Han. Highly Endurable Single Transistor Latch Operation Using Band-to-Band Tunneling. IEEE Electron Device Letters. 2025-07. https://doi.org/10.1109/led.2025.3571059