Performance evaluation of InN-based metal oxide semiconductor field effect transistor
Swati Verma; Pushpa Raikwal; Neeraj K. Jaiswal
- Published
- Publisher
- IEEE
- Journal / collection
- 2026 IEEE Guwahati Subsection Conference (GCON)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/gcon69192.2026.11648363
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Cite this source
Swati Verma; Pushpa Raikwal; Neeraj K. Jaiswal. Performance evaluation of InN-based metal oxide semiconductor field effect transistor. 2026 IEEE Guwahati Subsection Conference (GCON). 2026-06. https://doi.org/10.1109/gcon69192.2026.11648363