Skip to content
Independent research & intelligence
OPEN VARIABLE

Evidence-First Signal Intelligence

Menu

Research literature / Journal article

Oxide Semiconductor for Advanced Memory Architectures: Atomic Layer Deposition, Key Requirement and Challenges

Chi-Hoon Lee; Seong-Hwan Ryu; Taewon Hwang; Sang-Hyun Kim; Yoon-Seo Kim; Jin-Seong Park

Published
Publisher
Springer Science and Business Media LLC
Journal / collection
Nano-Micro Letters
Research area
Semiconductors
Source type
Journal article
DOI
10.1007/s40820-025-02013-7

Read the original source ↗

The original publisher provides the full text and its access options.

Cite this source

Chi-Hoon Lee; Seong-Hwan Ryu; Taewon Hwang; Sang-Hyun Kim; Yoon-Seo Kim; Jin-Seong Park. Oxide Semiconductor for Advanced Memory Architectures: Atomic Layer Deposition, Key Requirement and Challenges. Nano-Micro Letters. 2026-01-05. https://doi.org/10.1007/s40820-025-02013-7

Download RIS