Cloud-Scale Data Engineering for Real-Time Semiconductor Testing and AI-Powered Chip Diagnostics
Botlagunta Preethish Nandan
- Published
- Publisher
- Ess & Ess Research Publications
- Journal / collection
- International Journal of Computer Technology and Electronics Communication
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.15680/ijctece.2026.0903009
The original publisher provides the full text and its access options.
Cite this source
Botlagunta Preethish Nandan. Cloud-Scale Data Engineering for Real-Time Semiconductor Testing and AI-Powered Chip Diagnostics. International Journal of Computer Technology and Electronics Communication. 2026-05-09. https://doi.org/10.15680/ijctece.2026.0903009